TH-BP209-VIS - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Imperial rack-space_8u 2 mm Wide-Key-Slot FC/PC Bulkhead

2 mm Wide-Key-Slot FC/PC Bulkhead Adapter

Curved tip is easy to pick up from flat surfaces and allows faster initial threading to speed installation

supporting various 100G client services including 100GBASE-LR4/100GBASEER4 and 100GBASE-SR4

A special-purpose knife

TH-BP209-VIS - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Imperial rack-space_8u 2 mm Wide-Key-Slot FC/PC BulkheadTH BP209 VIS Dual Scanning Slit Beam Profiler, 200 1100 nm, 2. 5 m 9 mm, Imperial Product Drawing Wavelength Range 200 1100 nm Detector Material UV Enhanced Si Aperture Diameter 9 mm Scan Methods Scanning Slits, Knife Edge Slit Sizes 5 m and 25 m Beam Diameter Range 2. 5 m 9 mm Features Three Dual Scanning Slit Beam Profiler Models Item # THBP209VIS( M) for 200 nm 1100 nm Item # THBP209IR1( M) for 500 nm 1700 nm Item # THBP209IR2( M) for 900 nm 2700